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Design considerations for a radiation hardened nonvolatile memoryMURRAY, J. R.IEEE transactions on nuclear science. 1993, Vol 40, Num 6, pp 1610-1618, issn 0018-9499Conference Paper

One hundred percent abrupt failure between two radiation levels in step-stress testing of electronic partsNAMENSON, A; MYERS, D.IEEE transactions on nuclear science. 1993, Vol 40, Num 6, pp 1709-1713, issn 0018-9499Conference Paper

Determination of funnel length from cross section versus LET measurementsGOLKE, K. W.IEEE transactions on nuclear science. 1993, Vol 40, Num 6, pp 1910-1917, issn 0018-9499Conference Paper

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Singel-word multiple-bit upsets in static random access devicesKOGA, R; PINKERTON, S. D; LIE, T. J et al.IEEE transactions on nuclear science. 1993, Vol 40, Num 6, pp 1941-1946, issn 0018-9499Conference Paper

Single event induced charge transport modeling of GaAs MESFETsWEATHERFORD, T. R; MCMORROW, D; CURTICE, W. R et al.IEEE transactions on nuclear science. 1993, Vol 40, Num 6, pp 1867-1871, issn 0018-9499Conference Paper

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Behavior of a relativistic electron beam in a gas-filled drift tube as a function of gas pressureMERKEL, G; LITZ, M; ROBERTS, H et al.IEEE transactions on nuclear science. 1993, Vol 40, Num 6, pp 1434-1441, issn 0018-9499Conference Paper

Efficient β/γ Monte Carlo transport in repetitive structuresHALBLEIB, J. A; SCRIVNER, G. J.IEEE transactions on nuclear science. 1993, Vol 40, Num 6, pp 1402-1408, issn 0018-9499Conference Paper

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Molecular hydrogen, E' center hole traps, and radiation induced interface traps in MOS devicesCONLEY, J. F; LENAHAN, P. M.IEEE transactions on nuclear science. 1993, Vol 40, Num 6, pp 1335-1340, issn 0018-9499Conference Paper

Numerical analysis of single event burnout of power MOSFETsKUBOYAMA, S; MATSUDA, S; NAKAJIMA, M et al.IEEE transactions on nuclear science. 1993, Vol 40, Num 6, pp 1872-1879, issn 0018-9499Conference Paper

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Radiation response of silicon on diamond (SOD) devicesANNAMALAI, N. K; SAWYER, J; PRAMOD KARULKAR et al.IEEE transactions on nuclear science. 1993, Vol 40, Num 6, pp 1780-1786, issn 0018-9499Conference Paper